Myong K. Jeong, PI, $99,900, Samsung Global Research Program

Myong K. Jeong, PI, received an award totaling $99,900. The project title is Robust Virtual Metrology and Diagnosis Methods Based on Big Sensor Data from Manufacturing Processes. The project is being funded by Samsung Global Research Program (World-wide competition in each area; awarded in big data analytics), 11/1/15-10/31/16.